Sirius XRS provides solutions in the following areas: Laboratory solutions for synchrotron users, material research and semiconductor X-ray metrology
Sirius XRS provides services in the following areas: Contract measurements
Refurbishment
X-ray Reflectivity
In-Plane Grazing incidence
High Resolution X-ray Diffraction
Grazing incidence powder diffraction
Reciprocal space map
Semiconductor Wafer Mapping
Methods Development
Welcome to the “Sirius X-ray Solutions GmbH”. We are a provider of X-ray Analytical Solutions for Material Science and Semiconductor Industries founded in 2015. We are an independent instruments integrator and we work together with established suppliers. We offer complete laboratory solutions to synchrotron users in the area of thin films, surface and in situ – characterization, X-ray semiconductor metrology solutions and services in X-ray diffraction analysis.
Please contact us by e-mail: info@sirius-xrs.com
Our address: Sirius X-ray Solutions GmbH Neue Strasse 95 73230 Kirchheim Unter Teck/Nabern Germany
