Material Research

X-ray scattering methods for material science from powder, small crystals, and thin films on different substrate.

  • New Materials crystal structure
  • Thin Film analysis via X-ray Reflectivity, high resolution X-ray diffraction, grazing incidence diffraction and X-ray fluorescence.
  • Composition Analysis via XRF.
  • Crystal orientation (small samples)
  • Microdiffraction
  • Stress and Texture
Standard methods are described in application “Services“.
 
For references:
  1. Elements of Modern X-ray Physics, by Jens Als-Nielsen and Des McMorrow, John Wiley & Sons, Ltd., 2001 (Modern x-ray physics & new developments)
  2. X-ray Diffraction, by B.E. Warren, General Publishing Company, 1969, 1990 (Classic x-ray physics book)
  3. Elements of X-ray Diffraction,2nd Ed., by B.D. Cullity, Addison-Wesley, 1978 (Covers most techniques used in traditional material characterization)